A Review of Data-Driven Prognostic for IGBT Remaining Useful Life

Chinese Journal of Electrical Engineering ›› 2018, Vol. 4 ›› Issue (3): 73-79.

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A Review of Data-Driven Prognostic for IGBT Remaining Useful Life

Xiaochun Fang^1,*, Shuai Lin¹, Xianjin Huang¹, Fei Lin¹, Zhongping Yang¹, Seiki Igarashi²

1. School of Electrical Engineering, Beijing Jiaotong University, Beijing, 100044, China;
2. Fuji Electric Co., Ltd, Tokyo 141-0032, Japan

Online:2018-09-25 Published:2019-10-31
Contact: * , E-mail: me330221789@126.com.
About author:Xiaochun Fang (S’14-M'17) received the B.S. and Ph.D degree from Beijing Jiaotong University, Beijing China, in 2010 and 2016, respectively, both in engineering. He is currently a Postdoctoral Research Fellow in the School of Electrical Engineering, Beijing Jiaotong University, Beijing, China. His research interests include traction converter and motor drives, energy management for railway systems, IGBT fault mechanism and failure prediction. Shuai Lin received the B.S. degree from Beijing Jiaotong University, Beijing, China, in 2017 in electrical engineering. He has been working toward the Ph.D. degree in the School of Electrical Engineering, Beijing Jiaotong University, Beijing, China. His research interests include motor drives, reliability of traction drive system. XianJin Huang received the B.S. degree in electrical engineering, M.S. degree in power electronics and electric drive, Ph.D. degree in traffic engineering from Beijing Jiaotong University, Beijing, China, in 2002, 2005 and 2014, respectively. He is currently an Associate Professor with the School of Electrical Engineering, Beijing Jiaotong University. His research interests include traction converter and power semiconductor application for railway systems. Fei Lin (M'05) received the B.S. degree from Xi'an Jiaotong University, Xi'an, China, the M.S. degree from Shandong University, Jinan, China, and the Ph.D. degree from Tsinghua University, Beijing, China, in 1997, 2000, 2004, respectively, all in electrical engineering. He is currently a Professor in the School of Electrical Engineering, Beijing Jiaotong University, Beijing, China. His research interests include traction converter and motor drives, energy management for railway systems, digital control of powerelectronic- based devices. Zhongping Yang (M'14) received the B.Eng. degree from Tokyo University of Mercantile Marine, Tokyo, Japan in 1997, and reveived the M.Eng. degree and Ph.D. degree from the University of Tokyo, Tokyo, Japan in 1999 and 2002 respectively, all in electrical engineering. He is currently a Professor in the School of Electrical Engineering, Beijing Jiaotong University, Beijing, China. His research interests include high-speed rail integration technology, traction & regenerative braking technology, and wireless power transfer of urban rail vehicles. Seiki Igarashi is Senior Manager for Device Application Technology Department Fuji Electric Co., Ltd., Japan. In 1984, he started working at Fuji Electric Corporate R&D Center. He was development of the high efficiency Fuel Cell Inverter, UPS and Industrial Power supplies. From 2003, he moved to the Semiconductor Group. Now he interests New Power Device Development planning and its application technologies. He is member of IEE Japan. He received an Excellent Paper Award from IEE Japan in 2000.
Supported by:
Supported by Fuji Electric Corporate, Ltd.

Abstract

Abstract: Power converters with insulated gate bipolar transistor(IGBT) are widely used in diverse industrial applications such as traction systems. As the IGBT is one of the most fragile components in power electronics converter, remaining useful life(RUL) prognostic of IGBT is important to guarantee system reliability. This paper presents a review of data-driven prognostic for IGBT RUL. In this paper, common data-driven prognostic methods are summarized. Features of data-driven prognostic approaches of IGBT are discussed, and main approaches are compared to each other. Four common problems of these schemes are presented and discussed. In addition, some other desirable studies to improve IGBT RUL estimation are proposed.

Key words: Prognostic, remaining useful life, data-driven, IGBT

Xiaochun Fang, Shuai Lin, Xianjin Huang, Fei Lin, Zhongping Yang, Seiki Igarashi. A Review of Data-Driven Prognostic for IGBT Remaining Useful Life[J]. Chinese Journal of Electrical Engineering, 2018, 4(3): 73-79.

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A Review of Data-Driven Prognostic for IGBT Remaining Useful Life

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